Surface state and optical property of sulfur passivated InP
Identifieur interne : 000030 ( Main/Repository ); précédent : 000029; suivant : 000031Surface state and optical property of sulfur passivated InP
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Abstract
We report photoluminescence (PL) of indium phosphide (InP) surface passivated by sulfur (S). A three-fold enhancement of band edge emission from the bulk InP was observed after the InP was passivated by ammonium sulfide ((NH4)2S) solution for 10 min. X-ray photoelectron spectroscopy measurements indicate that the oxide at InP surface is removed after being sulfurized in (NH4)2S solution. However, the enhancement significantly decreases for a longer treatment time, which is maybe due to a thick S layer deposited at the InP surface resulting in low light transmission.
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<author><name>YONGFENG LI</name>
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<author><name>HAIFENG ZHAO</name>
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<author><name>XUAN FANG</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Changchun University of Science and Technology, 7186 Wei-Xing Road</s1>
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<author><name>JILONG TANG</name>
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<author><name>DAN FANG</name>
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<author><name>LIJUAN SUN</name>
<affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Yunnan forestry Technological College, No.1 Jindian, Panlong District</s1>
<s2>Kunming 650224, Yunnan Province</s2>
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<author><name>GUOJUN LIU</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Changchun University of Science and Technology, 7186 Wei-Xing Road</s1>
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<author><name>BIN YAO</name>
<affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Key Laboratory of Physics and Technology for Advanced Batteries, Ministry of Education, College of Physics, Jilin University</s1>
<s2>Changchun 130012</s2>
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<author><name>XIAOHUI MA</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Changchun University of Science and Technology, 7186 Wei-Xing Road</s1>
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<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Binary compounds</term>
<term>Edge emission</term>
<term>Indium phosphide</term>
<term>Light transmission</term>
<term>Optical characteristic</term>
<term>Optical properties</term>
<term>Passivation</term>
<term>Photoluminescence</term>
<term>Sulfur</term>
<term>Surface states</term>
<term>Thick films</term>
<term>X-ray photoelectron spectra</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Etat surface</term>
<term>Caractéristique optique</term>
<term>Propriété optique</term>
<term>Photoluminescence</term>
<term>Emission latérale</term>
<term>Spectre photoélectron RX</term>
<term>Couche épaisse</term>
<term>Transmission lumière</term>
<term>Passivation</term>
<term>Soufre</term>
<term>Phosphure d'indium</term>
<term>Composé binaire</term>
<term>7867</term>
<term>InP</term>
</keywords>
<keywords scheme="Wicri" type="concept" xml:lang="fr"><term>Soufre</term>
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<front><div type="abstract" xml:lang="en">We report photoluminescence (PL) of indium phosphide (InP) surface passivated by sulfur (S). A three-fold enhancement of band edge emission from the bulk InP was observed after the InP was passivated by ammonium sulfide ((NH<sub>4</sub>
)<sub>2</sub>
S) solution for 10 min. X-ray photoelectron spectroscopy measurements indicate that the oxide at InP surface is removed after being sulfurized in (NH<sub>4</sub>
)<sub>2</sub>
S solution. However, the enhancement significantly decreases for a longer treatment time, which is maybe due to a thick S layer deposited at the InP surface resulting in low light transmission.</div>
</front>
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<sZ>3 aut.</sZ>
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<s2>Kunming 650224, Yunnan Province</s2>
<s3>CHN</s3>
<sZ>8 aut.</sZ>
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<fA14 i1="04"><s1>State Key Laboratory of Luminescence and Applications, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences</s1>
<s2>Changchun 130033</s2>
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<fC01 i1="01" l="ENG"><s0>We report photoluminescence (PL) of indium phosphide (InP) surface passivated by sulfur (S). A three-fold enhancement of band edge emission from the bulk InP was observed after the InP was passivated by ammonium sulfide ((NH<sub>4</sub>
)<sub>2</sub>
S) solution for 10 min. X-ray photoelectron spectroscopy measurements indicate that the oxide at InP surface is removed after being sulfurized in (NH<sub>4</sub>
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S solution. However, the enhancement significantly decreases for a longer treatment time, which is maybe due to a thick S layer deposited at the InP surface resulting in low light transmission.</s0>
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<s4>INC</s4>
<s5>56</s5>
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<fC03 i1="14" i2="3" l="FRE"><s0>InP</s0>
<s4>INC</s4>
<s5>82</s5>
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